Datenblatt-Suchmaschine für elektronische Bauteile |
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FDD6680AS_NL Datenblatt(PDF) 7 Page - Fairchild Semiconductor |
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FDD6680AS_NL Datenblatt(HTML) 7 Page - Fairchild Semiconductor |
7 / 8 page FDD6680AS Rev A (X) Typical Characteristics VDS L Figure 12. Unclamped Inductive Load Test Circuit Figure 13. Unclamped Inductive Waveforms Figure 17. Switching Time Waveforms RGE DUT VGS IAS 0.01 Ω VDD + - tp 0V vary tP to obtain required peak IAS VGS tAV tP IAS VDS VDD BVDSS Figure 16. Switching Time Test Circuit VDS RL RGEN DUT VDD VGS Pulse Width ≤ 1µs Duty Cycle ≤ 0.1% VGS + - tr tf td(ON) td(OFF ) tON tOFF Pulse Width 10% 10% 90% 10% 90% 50% 90% 50% 0V 0V VGS VDS Figure 14. Gate Charge Test Circuit Figure 15. Gate Charge Waveform VGS QGS QGD QG(TOT) 10V Charge, (nC) DUT VDD VGS Ig(REF + - + - Same type as Drain Current 1 µF 10 µF 10V 50k Ω |
Ähnliche Teilenummer - FDD6680AS_NL |
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Ähnliche Beschreibung - FDD6680AS_NL |
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