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LM101AHRQMLV Datenblatt(PDF) 1 Page - National Semiconductor (TI) |
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LM101AHRQMLV Datenblatt(HTML) 1 Page - National Semiconductor (TI) |
1 / 15 page Original Creation Date: 01/20/00 Last Update Date: 09/17/03 Last Major Revision Date: 07/18/02 MRLM101A-X-RH REV 1B2 MICROCIRCUIT DATA SHEET SINGLE OPERATIONAL AMPLIFIER - EXTERNALLY COMPENSATED: ALSO AVAILABLE GUARANTEED TO 100k rd(Si) TESTED TO MIL-STD-883, METHOD 1019 General Description The LM101A is a general purpose operational amplifier which features improved performance over industry standards such as the LM709. Advanced processing techniques make possible an order of magnitude reduction in input currents, and a redesign of the biasing circuitry reduces the temperature drift of input current. This amplifier offers many features which make its application nearly foolproof: overload protection on the input and output, no latch-up when the common mode range is exceeded, and freedom from oscillations and compensation with a single 30 pF capacitor. It has advantages over internally compensated amplifiers in that the frequency compensation can be tailored to the particular application. For example, in low frequency circuits it can be overcompensated for increased stability margin. Or the compensation can be optimized to give more than a factor of ten improvement in high frequency performance for most applications. In addition, the device provides better accuracy and lower noise in high impedance circuitry. The low input currents also make it particularly well suited for long interval integrators or timers, sample and hold circuits and low frequency waveform generators. Further, replacing circuits where matched transistor pairs buffer the inputs of conventional IC op amps, it can give lower offset voltage and a drift at a lower cost. NS Part Numbers LM101AH-QMLV LM101AHRQMLV LM101AJ-QMLV LM101AW-QMLV LM101AWRQMLV Industry Part Number LM101A Prime Die LM101A Controlling Document SEE FEATURES SECTION Processing MIL-STD-883, Method 5004 Quality Conformance Inspection MIL-STD-883, Method 5005 Subgrp Description Temp ( C) o 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 1 |
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