Datenblatt-Suchmaschine für elektronische Bauteile |
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74ABTH16374BDGG Datenblatt(PDF) 7 Page - NXP Semiconductors |
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74ABTH16374BDGG Datenblatt(HTML) 7 Page - NXP Semiconductors |
7 / 10 page Philips Semiconductors Product specification 74ABT16374B 74ABTH16374B 16-bit D-type flip-flop; positive-edge trigger (3-State) 1998 Feb 27 7 OE VM tPZH tPHZ 0V nQx VM VM SH00079 VOH VOH –0.3V Waveform 3. 3-State Output Enable Time to High Level and Output Disable Time from High Level OE tPZL tPLZ nQx VM VM VM SH00080 VOL VOL + 0.3V Waveform 4. 3-State Output Enable Time to Low Level and Output Disable Time from Low Level TEST CIRCUIT AND WAVEFORM PULSE GENERATOR RT VIN D.U.T. VOUT RL VCC RL 7.0V Test Circuit for 3-State Outputs VM VM tW AMP (V) NEGATIVE PULSE 10% 10% 90% 90% 0V VM VM tW AMP (V) POSITIVE PULSE 90% 90% 10% 10% 0V tTHL (tF) tTLH (tR)tTHL (tF) tTLH (tR) VM = 1.5V Input Pulse Definition DEFINITIONS RL = Load resistor; see AC CHARACTERISTICS for value. CL = Load capacitance includes jig and probe capacitance; see AC CHARACTERISTICS for value. RT = Termination resistance should be equal to ZOUT of pulse generators. INPUT PULSE REQUIREMENTS FAMILY Amplitude Rep. Rate tW tR tF 74ABT/H16 3.0V 1MHz 500ns 2.5ns 2.5ns SWITCH POSITION TEST SWITCH tPLZ closed tPZL closed All other open SA00018 CL |
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