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SN74ABT8646DLG4 Datenblatt(PDF) 2 Page - Texas Instruments |
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SN74ABT8646DLG4 Datenblatt(HTML) 2 Page - Texas Instruments |
2 / 32 page SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) Transceiver function is controlled by output-enable (OE) and direction (DIR) inputs. When OE is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When OE is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses. Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that can be performed with the ’ABT8646. In the test mode, the normal operation of the SCOPE bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudorandom pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8646 is characterized for operation over the full military temperature range of −55 °C to 125°C. The SN74ABT8646 is characterized for operation from −40 °C to 85°C. FUNCTION TABLE INPUTS DATA I/O OPERATION OR FUNCTION OE DIR CLKAB CLKBA SAB SBA A1−A8 B1−B8 OPERATION OR FUNCTION X X ↑ X X X Input Unspecified† Store A, B unspecified† X XX ↑ X X Unspecified† Input Store B, A unspecified† H X ↑ ↑ X X Input Input Store A and B data H X H or L H or L X X Input disabled Input disabled Isolation, hold storage L L X X X L Output Input Real-time B data to A bus L L X H or L X H Output Input disabled Stored B data to A bus L H X X L X Input Output Real-time A data to B bus L H H or L X H X Input disabled Output Stored A data to B bus † The data-output functions can be enabled or disabled by various signals at OE and DIR. Data-input functions are always enabled; i.e., data at the bus pins is stored on every low-to-high transition of the clock inputs. |
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