Datenblatt-Suchmaschine für elektronische Bauteile |
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74LVC125DB Datenblatt(PDF) 3 Page - NXP Semiconductors |
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74LVC125DB Datenblatt(HTML) 3 Page - NXP Semiconductors |
3 / 10 page Philips Semiconductors Product specification 74LVC125 Quad buffer/line driver; 3-State 1997 Mar 18 3 FUNCTION TABLE INPUTS OUTPUT nOE nA nY L L L L H H H X Z NOTES: H = HIGH voltage level L = LOW voltage level X = don’t care Z = high impedance OFF-state LOGIC SYMBOL (IEEE/IEC) SV00457 1 2 EN1 1 3 4 5 6 10 9 8 13 12 11 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER CONDITIONS LIMITS UNIT SYMBOL PARAMETER CONDITIONS MIN MAX UNIT VCC DC supply voltage (for max. speed performance) 2.7 3.6 V VCC DC supply voltage (for low-voltage applications) 1.2 3.6 V VI DC input voltage range 0 5.5 V VI/O DC input voltage range for I/Os 0 VCC V VO DC output voltage range 0 VCC V Tamb Operating free-air temperature range –40 +85 °C tr, tf Input rise and fall times VCC = 1.2 to 2.7V VCC = 2.7 to 3.6V 0 0 20 10 ns/V ABSOLUTE MAXIMUM RATINGS1 In accordance with the Absolute Maximum Rating System (IEC 134). Voltages are referenced to GND (ground = 0 V). SYMBOL PARAMETER CONDITIONS RATING UNIT VCC DC supply voltage –0.5 to +6.5 V IIK DC input diode current VI t 0 –50 mA VI DC input voltage Note 2 –0.5 to +5.5 V VI/O DC input voltage range for I/Os –0.5 to VCC +0.5 V IOK DC output diode current VO uVCC or VO t 0 "50 mA VOUT DC output voltage Note 2 –0.5 to VCC +0.5 V IOUT DC output source or sink current VO = 0 to VCC "50 mA IGND, ICC DC VCC or GND current "100 mA Tstg Storage temperature range –60 to +150 °C Power dissipation per package PTOT – plastic mini-pack (SO) above +70 °C derate linearly with 8 mW/K 500 mW – plastic shrink mini-pack (SSOP and TSSOP) above +60 °C derate linearly with 5.5 mW/K 500 mW NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. |
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