Datenblatt-Suchmaschine für elektronische Bauteile |
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MC145202F Datenblatt(PDF) 7 Page - Motorola, Inc |
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MC145202F Datenblatt(HTML) 7 Page - Motorola, Inc |
7 / 24 page MC145202 MOTOROLA 7 LOOP SPECIFICATIONS (VDD = VCC = 2.7 to 5.5 V unless otherwise indicated, TA = – 40 to + 85°C) Sb l P T C di i Fig. Guaranteed Operating Range Ui Symbol Parameter Test Condition Fig. No. Min Max Unit Pin Input Sensitivity Range, fin 500 MHz ≤ fin ≤ 2000 MHz 7 – 10 4 dBm* fref Input Frequency, REFin Externally Driven in Reference Mode Vin ≥ 400 mV p–p 2.7 ≤ VDD < 4.5 V 4.5 ≤ VDD ≤ 5.5 V 8 1.5 1.5 20 30 MHz fXTAL Crystal Frequency, Crystal Mode C1 ≤ 30 pF, C2 ≤ 30 pF, Includes Stray Capacitance 9 2 15 MHz fout Output Frequency, REFout CL = 20 pF, Vout ≥ 1 V p–p 10, 12 dc 10 MHz f Operating Frequency of the Phase Detectors dc 2 MHz tw Output Pulse Width ( φR, φV, and LD) fR in Phase with fV, CL = 20 pF, φR and φV active for LD measurement, ** VPD = 2.7 to 5.5 V VDD = 2.7 V VDD = 4.5 V VDD = 5.5 V 11, 12 40 18 14 120 60 50 ns tTLH, tTHL Output Transition Times (LD, φV, and φR) CL = 20 pF, VPD = 2.7 V, VDD = VCC = 2.7 V 11, 12 — 80 ns Cin Input Capacitance, REFin — 7 pF * Power level at the input to the dc block. ** When PDout is active, LD minimum pulse width is approximately 5 ns. Figure 7. Test Circuit SINE WAVE GENERATOR 50 Ω DEVICE UNDER TEST 0.01 µF TEST POINT VCC VDD REFin GND OUTPUT A Vin Figure 8. Test Circuit — Reference Mode (fR) TEST POINT REFout V+ DEVICE UNDER TEST C1 TEST POINT VCC VDD OUTPUT A GND REFin REFout C2 Figure 9. Test Circuit — Crystal Mode (fR) V+ 50% REFout 1 / f REFout Figure 10. Switching Waveform 10% 90% OUTPUT tTLH tTHL Figure 11. Switching Waveform 50% tw TEST POINT DEVICE UNDER TEST CL* * Includes all probe and fixture capacitance. Figure 12. Test Circuit DC BLOCK 50 Ω PAD SINE WAVE GENERATOR 50 Ω VCC VDD GND V+ TEST POINT OUTPUT A (fV) DEVICE UNDER TEST fin fin NOTE: Alternately, the 50 Ω pad may be a T network. |
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