MC100EPT21

http://onsemi.com

2

1

2

3

45

6

7

8

Q

GND

Figure 1. Logic Diagram and 8−Lead Pinout (Top View)

D

NC

D

NC

LVTTL

LVPECL

Table 1. PIN DESCRIPTION

PIN

Q

D**, D**

Differential LVPECL/LVDS/CML Input

FUNCTION

LVTTL/LVCMOS Output

Output Reference Voltage

Positive Supply

GND

Ground

NC

No Connect

EP

Exposed pad must be connected to a

sufficient thermal conduit. Electrically

connect to the most negative supply or

leave floating open.

Table 2. ATTRIBUTES

Characteristics

Value

Internal Input Pulldown Resistor

50 k

W

Internal Input Pullup Resistor

50 k

W

ESD Protection

Human Body Model

Machine Model

Charged Device Model

> 1.5 kV

> 100 V

> 2 kV

Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)

Level 1

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−0 @ 0.125 in

Transistor Count

81 Devices

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

1. For additional information, see Application Note AND8003/D.

Table 3. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

PECL Power Supply

GND = 0 V

3.8

V

PECL Input Voltage

GND = 0 V

0 to 3.8

V

± 0.5

mA

Operating Temperature Range

−40 to +85

°C

Storage Temperature Range

−65 to +150

°C

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

SO−8

SO−8

190

130

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

SO−8

41 to 44

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

TSSOP−8

TSSOP−8

185

140

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

Standard Board

TSSOP−8

41 to 44

°C/W

Thermal Resistance (Junction−to−Ambient)

0 lfpm

500 lfpm

DFN8

DFN8

129

84

°C/W

°C/W

Wave Solder

Pb

Pb−Free

< 2 to 3 sec @ 248

°C

<2 to 3 sec @ 260

°C

265

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.