Datenblatt-Suchmaschine für elektronische Bauteile |
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TDA1387T Datenblatt(PDF) 6 Page - NXP Semiconductors |
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TDA1387T Datenblatt(HTML) 6 Page - NXP Semiconductors |
6 / 16 page 1995 Dec 11 6 Philips Semiconductors Preliminary specification Stereo Continuous Calibration DAC (CC-DAC) TDA1387T LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134). Notes 1. Human body model: C = 100 pF; R = 1.5 k Ω; 3 zaps positive and 3 zaps negative. 2. Machine model: C = 200 pF; L = 0.5 µH; R = 10 Ω; 3 zaps positive and 3 zaps negative. THERMAL CHARACTERISTICS SYMBOL DESCRIPTION CONDITIONS MIN. MAX. UNIT VDD supply voltage − 6.0 V Txtal(max) maximum crystal temperature − +150 °C Tstg storage temperature −55 +150 °C Tamb operating ambient temperature −40 +85 °C Ves electrostatic handling note 1 −2000 +2000 V note 2 −200 +200 V SYMBOL DESCRIPTION VALUE UNIT Rth j-a thermal resistance from junction to ambient in free air 210 K/W (a) Calibration. (b) Operation. Fig.3 Calibration principle. |
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