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SN74ABTH182502APM Datenblatt(PDF) 1 Page - Texas Instruments

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Teilenummer SN74ABTH182502APM
Bauteilbeschribung  SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
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Hersteller  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SN74ABTH182502APM Datenblatt(HTML) 1 Page - Texas Instruments

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SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A
SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS164E – AUGUST 1993 – REVISED DECEMBER 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Members of the Texas Instruments
SCOPE
™ Family of Testability Products
D Members of the Texas Instruments
Widebus
™ Family
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
D UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D B-Port Outputs of ’ABTH182502A Devices
Have Equivalent 25-
Ω Series Resistors, So
No External Resistors Are Required
D State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design
D One Boundary-Scan Cell Per I/O
Architecture Improves Scan Efficiency
D SCOPE Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
D Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat (HV) Packages Using
25-mil Center-to-Center Spacings
1B4
1B5
1B6
GND
1B7
1B8
1B9
VCC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
VCC
2A1
2A2
2A3
GND
2A4
2A5
2A6
SN54ABTH18502A, SN54ABTH182502A . . . HV PACKAGE
(TOP VIEW)
NC – No internal connection
60
59
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28 29 30 31 32 33 34
87
6
5
4
93
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
Copyright
© 1996, Texas Instruments Incorporated
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
SCOPE, Widebus, UBT, and EPIC-
ΙΙB are trademarks of Texas Instruments Incorporated.


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