Datenblatt-Suchmaschine für elektronische Bauteile |
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ML145028EP Datenblatt(PDF) 6 Page - LANSDALE Semiconductor Inc. |
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ML145028EP Datenblatt(HTML) 6 Page - LANSDALE Semiconductor Inc. |
6 / 19 page www.lansdale.com Page 6 of 19 Issue 0 LANSDALE Semiconductor, Inc. ML145026, ML145027, ML145028 10% 90% ANY OUTPUT tTLH tTHL Figure 4. Figure 5. Figure 6. Figure 7. Figure 8. Test Circuit 10% 90% Din tf tr VDD VSS RTC 50% 1/fosc TE 50% VDD VSS tw DEVICE UNDER TEST * Includes all probe and fixture capacitance. CL* OUTPUT TEST POINT |
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