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74ABT543ADB Datenblatt(PDF) 5 Page - NXP Semiconductors

Teilenummer 74ABT543ADB
Bauteilbeschribung  Octal latched transceiver with dual enable (3-State)
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Hersteller  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74ABT543ADB Datenblatt(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74ABT543A
Octal latched transceiver with dual enable
(3-State)
1998 Sep 24
5
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Tamb = +25°C
Tamb = –40°C
to +85
°C
UNIT
Min
Typ
Max
Min
Max
VIK
Input clamp voltage
VCC = 4.5V; IIK = –18mA
–0.9
–1.2
–1.2
V
VCC = 4.5V; IOH = –3mA; VI = VIL or VIH
2.5
3.2
2.5
V
VOH
High-level output voltage
VCC = 5.0V; IOH = –3mA; VI = VIL or VIH
3.0
3.7
3.0
V
VCC = 4.5V; IOH = –32mA; VI = VIL or VIH
2.0
2.3
2.0
V
VOL
Low-level output voltage
VCC = 4.5V; IOL = 64mA; VI = VIL or VIH
0.3
0.55
0.55
V
VRST
Power-up output low
voltage3
VCC = 5.5V; IO = 1mA; VI = GND or VCC
0.13
.55
.55
V
II
Input leakage
Control pins
VCC = 5.5V; VI = GND or 5.5V
±0.01
±1.0
±1.0
µA
current
Data pins
VCC = 5.5V; VI = GND or 5.5V
±5
±100
±100
µA
IOFF
Power-off leakage current
VCC = 0.0V; VO or VI ≤ 4.5V
±5.0
±100
±100
µA
IPU/PD
Power-up/down 3-State
output current4
VCC = 2.1V; VO = 0.5V; VI = GND or VCC;
V OE = Don’t care
±5.0
±50
±50
µA
IIH + IOZH
3-State output High current
VCC = 5.5V; VO = 2.7V; VI = VIL or VIH
5.0
50
50
µA
IIL + IOZL
3-State output Low current
VCC = 5.5V; VO = 0.5V; VI = VIL or VIH
–5.0
–50
–50
µA
ICEX
Output high leakage current
VCC = 5.5V; VO = 5.5V; VI = GND or VCC
5.0
50
50
µA
IO
Output current1
VCC = 5.5V; VO = 2.5V
–40
–65
–180
–40
–180
mA
ICCH
VCC = 5.5V; Outputs High, VI = GND or VCC
110
250
250
µA
ICCL
Quiescent supply current
VCC = 5.5V; Outputs Low, VI = GND or VCC
20
30
30
mA
ICCZ
VCC = 5.5V; Outputs 3-State;
VI = GND or VCC
110
250
250
µA
∆ICC
Additional supply current per
input pin2
VCC = 5.5V; one input at 3.4V,
other inputs at VCC or GND; VCC = 5.5V
0.3
1.5
1.5
mA
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
4. This parameter is valid for any VCC between 0V and 2.1V, with a transition time of up to 10msec. From VCC = 2.1V to VCC = 5V ± 10%, a
transition time of up to 100
µsec is permitted.


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