Datenblatt-Suchmaschine für elektronische Bauteile |
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SN74ABT18504PM Datenblatt(PDF) 5 Page - Texas Instruments |
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SN74ABT18504PM Datenblatt(HTML) 5 Page - Texas Instruments |
5 / 34 page SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 Terminal Functions PIN NAME DESCRIPTION A1 – A20 Normal-function A-bus I/O ports. See function table for normal-mode logic. B1 – B20 Normal-function B-bus I/O ports. See function table for normal-mode logic. CLKAB, CLKBA Normal-function clock inputs. See function table for normal-mode logic. CLKENAB, CLKENBA Normal-function clock enables. See function table for normal-mode logic. GND Ground LEAB, LEBA Normal-function latch enables. See function table for normal-mode logic. OEAB, OEBA Normal-function output enables. See function table for normal-mode logic. TCK Test clock. One of four pins required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to the test clock. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. TDI Test data input. One of four pins required by IEEE Standard 1149.1-1990. The test data input is the serial input for shifting data through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected. TDO Test data output. One of four pins required by IEEE Standard 1149.1-1990. The test data output is the serial output for shifting data through the instruction register or selected data register. TMS Test mode select. One of four pins required by IEEE Standard 1149.1-1990. The test mode select input directs the device through its test access port (TAP) controller states. An internal pullup forces TMS to a high level if left unconnected. VCC Supply voltage |
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