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SN74ABT18652PM Datenblatt(PDF) 3 Page - Texas Instruments

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Teilenummer SN74ABT18652PM
Bauteilbeschribung  SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
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SN54ABT18652, SN74ABT18652
SCAN TEST DEVICES WITH
18-BIT BUS TRANSCEIVERS AND REGISTERS
SCBS132A – AUGUST 1992 – REVISED OCTOBER 1992
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
In the test mode, the normal operation of the SCOPE
™ bus transceivers and registers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can
perform boundary scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),
test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform
other testing functions such as parallel signature analysis on data inputs and pseudo-random pattern generation
from data outputs. All testing and scan operations are synchronized to the TAP interface.
Additional flexibility is provided in the test mode through the use of two boundary scan cells (BSCs) for each
I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT
instruction is also included to ease the testing of memories and other circuits where a binary count addressing
scheme is useful.
The SN54ABT18652 is characterized over the full military temperature range of – 55
°C to 125°C. The
SN74ABT18652 is characterized for operation from – 40
°C to 85°C.
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
DATA I/O
OPERATION OR FUNCTION
OEAB
OEBA
CLKAB
CLKBA
SAB
SBA
A1 THRU A9
B1 THRU B9
OPERATION OR FUNCTION
L
H
L
L
X
X
Input disabled
Input disabled
Isolation
L
H
↑↑
X
X
Input
Input
Store A and B data
X
H
L
X
X
Input
Unspecified†
Store A, hold B
H
H
↑↑
X‡
X
Input
Output
Store A in both registers
L
XL
X
X
Unspecified†
Input
Hold A, store B
L
L
↑↑
XX‡
Output
Input
Store B in both registers
L
L
X
X
X
L
Output
Input
Real-time B data to A bus
L
L
X
L
X
H
Output
Input
Stored B data to A bus
H
H
X
X
L
X
Input
Output
Real-time A data to B bus
H
H
L
X
H
X
Input
Output
Stored A data to B bus
H
L
L
L
H
H
Output
Output
Stored A data to B bus and
stored B data to A bus
† The data output functions can be enabled or disabled by a variety of level combinations at the OEAB or OEBA inputs. Data input functions are
always enabled; i.e., data at the bus pins is stored on every low-to-high transition on the clock inputs.
‡ Select control = L: clocks can occur simultaneously.
Select control = H: clocks must be staggered in order to load both registers.


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