Datenblatt-Suchmaschine für elektronische Bauteile |
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NBXSBA008 Datenblatt(PDF) 4 Page - ON Semiconductor |
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NBXSBA008 Datenblatt(HTML) 4 Page - ON Semiconductor |
4 / 6 page NBXSBA008 http://onsemi.com 4 Figure 3. Typical Phase Noise Plot Table 7. RELIABILITY COMPLIANCE Parameter Standard Method Shock Mechanical MIL−STD−833, Method 2002, Condition B Solderability Mechanical MIL−STD−833, Method 2003 Vibration Mechanical MIL−STD−833, Method 2007, Condition A Solvent Resistance Mechanical MIL−STD−202, Method 215 Thermal Shock Environment MIL−STD−833, Method 1011, Condition A Moisture Level Sensitivity Environment MSL1 260°C per IPC/JEDEC J−STD−020D |
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Ähnliche Beschreibung - NBXSBA008 |
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