Datenblatt-Suchmaschine für elektronische Bauteile |
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74AHCT1G32GW Datenblatt(PDF) 7 Page - NXP Semiconductors |
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74AHCT1G32GW Datenblatt(HTML) 7 Page - NXP Semiconductors |
7 / 12 page 74AHC_AHCT1G32_7 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 07 — 14 May 2009 7 of 12 NXP Semiconductors 74AHC1G32; 74AHCT1G32 2-input OR gate Test data is given in Table 8. Definitions for test circuit: CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. Fig 6. Load circuitry for switching times mna101 VCC VI VO RT CL PULSE GENERATOR DUT |
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Ähnliche Beschreibung - 74AHCT1G32GW |
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