Datenblatt-Suchmaschine für elektronische Bauteile |
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TS3L500AERHUR Datenblatt(PDF) 9 Page - Texas Instruments |
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TS3L500AERHUR Datenblatt(HTML) 9 Page - Texas Instruments |
9 / 17 page PARAMETER MEASUREMENT INFORMATION CL (see Note A) TEST CIRCUIT S1 2 × VCC Open GND RL RL VOH VOL VOLTAGE WAVEFORMS OUTPUT SKEW (tsk(o)) Data Out at YB1 or YB2 NOTES: A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. D. The outputs are measured one at a time, with one transition per measurement. 50 Ω VG1 VCC DUT 50 Ω VIN 50 Ω VG2 50 Ω VI TEST RL S1 CL 3.3 V ± 0.3 V VCC Vin tsk(p) tsk(o) 3.3 V ± 0.3 V Open Open 200 Ω 200 Ω VCC or GND VCC or GND 10 pF 10 pF Input Generator Input Generator VO (VOH + VOL)/2 VOH VOL Data Out at XB1 or XB2 (VOH + VOL)/2 3.5 V 1.5 V Data In at Ax or Ay 2.5 V tPLHx tPHLx tsk(o) tsk(o) tPLHy tPHLy tsk(o) = |tPLHy − tPLHx| or |tPHLy − tPHLx| VOH VOL VOLTAGE WAVEFORMS PULSE SKEW [tsk(p)] Output (VOH + VOL)/2 Input 2.5 V tPLH tPHL tsk(p) = |tPHL − tPLH| 3.5 V 1.5 V VO VI VO TS3L500AE www.ti.com ............................................................................................................................................................. SCDS246B – JUNE 2007 – REVISED JUNE 2009 (Skew) Figure 6. Test Circuit and Voltage Waveforms Copyright © 2007–2009, Texas Instruments Incorporated Submit Documentation Feedback 9 Product Folder Link(s): TS3L500AE |
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