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NBXDBA018LN1TAG Datenblatt(PDF) 2 Page - ON Semiconductor

Teilenummer NBXDBA018LN1TAG
Bauteilbeschribung  3.3 V, 155.52 MHz / 311.04MHz LVPECL Clock Oscillator
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Hersteller  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NBXDBA018LN1TAG Datenblatt(HTML) 2 Page - ON Semiconductor

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NBXDBB018, NBXDBA018
http://onsemi.com
2
FSEL
OE
GND
CLK
VDD
CLK
1
2
3
6
5
4
Figure 2. Pin Connections (Top View)
Table 1. PIN DESCRIPTION
Pin No.
Symbol
I/O
Description
1
OE
LVTTL/LVCMOS
Control Input
Output Enable Pin. When left floating pin defaults to logic HIGH and output is active.
See OE pin description Table 2.
2
FSEL
LVTTL/LVCMOS
Control Input
Output Frequency Select Pin. Pin will default to logic HIGH when left open. See Output
Frequency Select pin description Table 3.
3
GND
Power Supply
Ground 0 V
4
CLK
LVPECL Output
Non−Inverted Clock Output. Typically loaded with 50 W receiver termination resistor to
VTT = VDD − 2 V.
5
CLK
LVPECL Output
Inverted Clock Output. Typically loaded with 50 W receiver termination resistor to
VTT = VDD − 2 V.
6
VDD
Power Supply
Positive power supply voltage. Voltage should not exceed 3.3 V ±10%.
Table 2. OUTPUT ENABLE TRI−STATE FUNCTION
OE Pin
Output Pins
Open
Active
HIGH Level
Active
LOW Level
High Z
Table 3. OUTPUT FREQUENCY SELECT
FSEL Pin
Output Frequency (MHz)
Open
(pin will float high)
155.52
HIGH Level
155.52
LOW Level
311.04
Table 4. ATTRIBUTES
Characteristic
Value
Input Default State Resistor
170 kW
ESD Protection
Human Body Model
Machine Model
2 kV
200 V
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
1. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
Table 5. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Units
VDD
Positive Power Supply
GND = 0 V
4.6
V
Iout
LVPECL Output Current
Continuous
Surge
25
50
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−55 to +120
°C
Tsol
Wave Solder
See Figure 6
260
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.


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