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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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ADF4360-7 Datenblatt(PDF) 11 Page - Analog Devices |
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ADF4360-7 Datenblatt(HTML) 11 Page - Analog Devices |
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11 / 28 page  Data Sheet ADF4360-7 Rev. B | Page 11 of 28 MUXOUT AND LOCK DETECT The output multiplexer on the ADF4360 family allows the user to access various internal points on the chip. The state of MUXOUT is controlled by M3, M2, and M1 in the function latch. The full truth table is shown in Table 7. Figure 19 shows the MUXOUT section in block diagram form. Lock Detect MUXOUT can be programmed for two types of lock detect: digital and analog. Digital lock detect is active high. When LDP in the R counter latch is set to 0, digital lock detect is set high when the phase error on three consecutive phase detector cycles is less than 15 ns. With LDP set to 1, five consecutive cycles of less than 15 ns phase error are required to set the lock detect. It stays set high until a phase error of greater than 25 ns is detected on any subsequent PD cycle. The N-channel open-drain analog lock detect should be operated with an external pull-up resistor of 10 kΩ nominal. When a lock has been detected, this output is high with narrow low-going pulses. R COUNTER OUTPUT N COUNTER OUTPUT DIGITAL LOCK DETECT DGND CONTROL MUX MUXOUT DVDD ANALOG LOCK DETECT SDOUT Figure 19. MUXOUT Circuit INPUT SHIFT REGISTER The ADF4360 family’s digital section includes a 24-bit input shift register, a 14-bit R counter, and an 18-bit N counter comprised of a 5-bit A counter and a 13-bit B counter. Data is clocked into the 24-bit shift register on each rising edge of CLK. The data is clocked in MSB first. Data is transferred from the shift register to one of four latches on the rising edge of LE. The destination latch is determined by the state of the two control bits (C2, C1) in the shift register. These are the two LSBs, DB1 and DB0, shown in Figure 2. The truth table for these bits is shown in Table 5. Table 6 shows a summary of how the latches are programmed. Note that the test mode latch is used for factory testing and should not be programmed by the user. Table 5. C2 and C1 Truth Table Control Bits C2 C1 Data Latch 0 0 Control Latch 0 1 R Counter 1 0 N Counter (A and B) 1 1 Test Mode Latch VCO The VCO core in the ADF4360 family uses eight overlapping bands, as shown in Figure 20, to allow a wide frequency range to be covered without a large VCO sensitivity (KV) and resultant poor phase noise and spurious performance. The correct band is chosen automatically by the band select logic at power-up or whenever the N counter latch is updated. It is important that the correct write sequence be followed at power-up. This sequence is: 1. R counter latch 2. Control latch 3. N counter latch During band select, which takes five PFD cycles, the VCO VTUNE is disconnected from the output of the loop filter and connected to an internal reference voltage. 0.5 1.5 1.0 2.5 2.0 3.0 450 500 550 600 650 FREQUENCY (MHz) Figure 20. Frequency vs. VTUNE, ADF4360-7 The R counter output is used as the clock for the band select logic and should not exceed 1 MHz. A programmable divider is provided at the R counter input to allow division by 1, 2, 4, or 8 and is controlled by Bits BSC1 and BSC2 in the R counter latch. Where the required PFD frequency exceeds 1 MHz, the divide ratio should be set to allow enough time for correct band selection. |
Ähnliche Teilenummer - ADF4360-7 |
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Ähnliche Beschreibung - ADF4360-7 |
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