Datenblatt-Suchmaschine für elektronische Bauteile |
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OP27AZ Datenblatt(PDF) 5 Page - Analog Devices |
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OP27AZ Datenblatt(HTML) 5 Page - Analog Devices |
5 / 16 page REV. A –5– OP27 OP27N OP27G OP27GR Parameter Symbol Conditions Limit Limit Limit Unit INPUT OFFSET VOLTAGE * VOS 35 60 100 µV Max INPUT OFFSET CURRENT IOS 35 50 75 nA Max INPUT BIAS CURRENT IB ±40 ±55 ±80 nA Max INPUT VOLTAGE RANGE IVR ±11 ±11 ±11 V Min COMMON-MODE REJECTION RATIO CMRR VCM = IVR 114 106 100 dB Min POWER SUPPLY PSRR VS = ±4 V to ±18 V 10 10 20 µV/V Max LARGE-SIGNAL VOLTAGE GAIN AVO RL ≥ 2 kΩ, V O = ±10 V 1000 1000 700 V/mV Min AVO RL ≥ 600 Ω, VO = ±10 V 800 800 600 V/mV Min OUTPUT VOLTAGE SWING VO RL ≥ 2 kΩ±12.0 ±12.0 +11.5 V Min VO RL2600n ±10.0 ±10.0 ±10.0 V Min POWER CONSUMPTION Pd VO = 0 140 140 170 mW Max NOTE *Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing. WAFER TEST LIMITS (@ V S = ±15 V, TA = 25 C unless otherwise noted.) DICE CHARACTERISTICS 1. NULL 2. (–) INPUT 3. (+) INPUT 4. V– 6. OUTPUT 7. V+ 8. NULL DIE SIZE 0.109 0.055 INCH, 5995 SQ. MILS (2.77 1.40mm, 3.88 SQ. mm) |
Ähnliche Teilenummer - OP27AZ |
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Ähnliche Beschreibung - OP27AZ |
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