©2006 Fairchild Semiconductor Corporation

www.fairchildsemi.com

HCPL06XX Rev. 1.0.8

3

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Recommended Operating Conditions

The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended

operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not

recommend exceeding them or designing to absolute maximum ratings.

*6.3mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is

5.0mA or less

Symbol

Parameter

Value

Units

Storage Temperature

-40 to +125

°C

Operating Temperature

-40 to +85

°C

EMITTER

DC/Average Forward Input Current

(each channel)

Single Channel

50

mA

Dual Channel

Enable Input Voltage

Not to exceed VCC by more than 500mV

Single Channel

5.5

V

Reverse Input Voltage (each channel)

5.0

V

Power Dissipation

Single Channel

45

mW

Dual Channel

DETECTOR

(1 minute max)

Supply Voltage

7.0

V

Output Current (each channel)

Single Channel

50

mA

Dual Channel

15

Output Voltage (each channel)

7.0

V

Collector Output Power Dissipation

Single Channel

85

mW

Dual Channel

85

Symbol

Parameter

Min.

Max.

Units

Input Current, Low Level

0

250

µA

Input Current, High Level

*6.3

15

mA

Supply Voltage, Output

4.5

5.5

V

Enable Voltage, Low Level

Single Channel only

0

0.8

V

Enable Voltage, High Level

Single Channel only

2.0

V

Operating Temperature

-40

+85

°C

NFan Out (TTL load)

Single Channel

8

TTL Loads

Dual Channel

5

Output Pull-up

330

4K

Ω