Datenblatt-Suchmaschine für elektronische Bauteile |
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BTA41-1000 Datenblatt(PDF) 4 Page - Shenzhen Luguang Electronic Technology Co., Ltd |
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BTA41-1000 Datenblatt(HTML) 4 Page - Shenzhen Luguang Electronic Technology Co., Ltd |
4 / 5 page Fig. 7: Relative variation of gate trigger current, holding current and latching current versus junction temperature (typical values). Fig. 8: Relative variation of critical rate of decrease of main current versus (dV/dt)c (typical values). -40 -20 0 20 40 60 80 100 120 140 0.0 0.5 1.0 1.5 2.0 2.5 Tj(°C) IGT,IH,IL[Tj] / IGT,IH,IL [Tj=25°C] IGT IH & IL 0.1 1.0 10.0 100.0 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 (dV/dt)c (V/µs) (dI/dt)c [(dV/dt)c] / Specified (dI/dt)c Fig. 9: Relative variation of critical rate of decrease of main current versus junction temperature. 0 25 50 75 100 125 0 1 2 3 4 5 6 Tj (°C) (dI/dt)c [Tj] / (dI/dt)c [Tj specified] BTA41-200 thru BTA41-1200 Discrete Traics (Isolated) http://www.luguang.cn mail:lge@luguang.cn |
Ähnliche Teilenummer - BTA41-1000 |
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Ähnliche Beschreibung - BTA41-1000 |
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