54ABT16245 datasheet(4/12 Pages) TI

Teilenummer	54ABT16245

Bauteilbeschribung	54ABT16245 16-Bit Transceiver with TRI-STATE Outputs

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OBSOLETE

54ABT16245

SNOS038C – AUGUST 1998 – REVISED APRIL 2013

www.ti.com

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

ABSOLUTE MAXIMUM RATINGS

(1) (2)

Storage Temperature

−65°C to +150°C

Ambient Temperature under Bias

−55°C to +125°C

Junction Temperature under Bias

Ceramic

−55°C to +175°C

VCC Pin Potential to ground Pin

−0.5V to +7.0V

Input Voltage (3)

−0.5V to +7.0V

Input Current (3)

−30 mA to +5.0 mA

Voltage Applied to Any Output

in the Disabled or Power-off State

−0.5V to 5.5V

in the HIGH State

−0.5V to VCC

Current Applied to Output

in LOW State (Max)

twice the rated IOL (mA)

DC Latchup Source Current

−500 mA

Over Voltage Latchup (I/O)

10V

(1)

Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation

under these conditions is not implied.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

(3)

Either voltage limit or current limit is sufficient to protect inputs.

RECOMMENDED OPERATING CONDITIONS

Free Air Ambient Temperature

Military

−55°C to +125°C

Supply Voltage

Military

+4.5V to +5.5V

Minimum Input Edge Rate

(

ΔV/Δt)

Data Input

50 mV/ns

Enable Input

20 mV/ns

DC Electrical Characteristics

Symbol

Parameter

ABT16245

Units

VCC

Conditions

Min

Typ

Max

VIH

Input HIGH Voltage

2.0

V

Recognized HIGH Signal

VIL

Input LOW Voltage

0.8

V

Recognized LOW Signal

VCD

Input Clamp Diode Voltage

−1.2

V

Min

IIN = −18 mA (OEn, T/Rn)

VOH

Output HIGH Voltage

54ABT

2.5

V

Min

IOH = −3 mA (An, Bn)

54ABT

2.0

V

Min

IOH = −24 mA (An, Bn)

VOL

Output LOW Voltage

54ABT

0.55

V

Min

IOL = 48 mA (An, Bn)

IIH

Input HIGH Current

5

μA

Max

VIN = 2.7V (OEn, T/Rn)

(1)

5

VIN = VCC (OEn, T/Rn)

IBVI

Input HIGH Current

7

μA

Max

VIN = 7.0V (OEn, T/Rn)

Breakdown Test

IBVIT

Input HIGH Current

100

μA

Max

VIN = 5.5V (An, Bn)

Breakdown Test (I/O)

IIL

Input LOW Current

−5

μA

Max

VIN = 0.5V (OEn, T/Rn)

(1)

−5

VIN = 0.0V (OEn, T/Rn)

VID

Input Leakage Test

IID = 1.9 μA (OEn, T/Rn)All Other Pins

4.75

V

0.0

Grounded

IIH + I

Output Leakage Current

50

μA

0

−

VOUT = 2.7V (An, Bn); OE = 2.0V

OZH

5.5V

IIL + I

Output Leakage Current

−50

μA

0

−

VOUT = 0.5V (An, Bn); OE = 2.0V

OZL

5.5V

(1)

Ensured, but not tested.

4

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