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74LVC125ADB Datenblatt(PDF) 8 Page - NXP Semiconductors

Teilenummer 74LVC125ADB
Bauteilbeschribung  Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
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Hersteller  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

74LVC125ADB Datenblatt(HTML) 8 Page - NXP Semiconductors

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74LVC125A
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 7 — 11 April 2013
8 of 16
NXP Semiconductors
74LVC125A
Quad buffer/line driver with 5 V tolerant input/outputs; 3-state
Test data is given in Table 9.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 8.
Test circuit for measuring switching times
VM
VM
tW
tW
10 %
90 %
0 V
VI
VI
negative
pulse
positive
pulse
0 V
VM
VM
90 %
10 %
tf
tr
tr
tf
001aae331
VEXT
VCC
VI
VO
DUT
CL
RT
RL
RL
G
Table 9.
Test data
Supply voltage
Input
Load
VEXT
VI
tr, tf
CL
RL
tPLH, tPHL
tPLZ, tPZL
tPHZ, tPZH
1.2 V
VCC
 2 ns
30 pF
1 k
open
2
 V
CC
GND
1.65 V to 1.95 V
VCC
 2 ns
30 pF
1 k
open
2
 V
CC
GND
2.3 V to 2.7 V
VCC
 2 ns
30 pF
500
open
2
 V
CC
GND
2.7V
2.7V
 2.5 ns
50 pF
500
open
2
 V
CC
GND
3.0Vto 3.6V
2.7V
 2.5 ns
50 pF
500
open
2
 V
CC
GND


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