Datenblatt-Suchmaschine für elektronische Bauteile |
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HCPL3700 Datenblatt(PDF) 7 Page - Fairchild Semiconductor |
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HCPL3700 Datenblatt(HTML) 7 Page - Fairchild Semiconductor |
7 / 11 page ©2005 Fairchild Semiconductor Corporation www.fairchildsemi.com HCPL3700 Rev. 1.0.3 7 Test Circuits 5 6 7 8 3 4 2 1 Z = 50 tr = 5ns Generator Pulse O Ω .1 µF bypass O (V ) +5V R L Output PHL t PLH t 5V 2.5V IN (V ) Input (V ) Output O 1.5 V 90% AC DC+ DC- AC GND V V O CC AC DC- DC+ AC 4 3 2 1 Output O GND V 5 6 (V ) R bypass .1 µF CC V 7 8 L O V FF IIN A B +5V C ** L * SEE NOTE 8 R * CC + Pulse Gen CM V - ** C IS 30 pF, WHICH INCLUDES PROBE AND STRAY WIRING CAPACITANCE L 90% 10% 10% r tt f 0V VO OL V Switching Pos. (A) I = 0 mA VO VCM Switching Pos. (B) I = 3.11 mA V (Max) V (Min) O O IN IN O V V C V VC 5V 5V V Pulse Amplitude = 50V Pulse Width = 1ms f = 100Hz T = T = 1.0 µs (10%–90%) IN rf Fig. 10. Test Circuit for Common Mode Transient Immunity and Typical Waveforms Fig. 9. Switching Test Circuit |
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