Multilayer Chip Varistor for Surge and

ESD Protection – L Type Series

Document No

TMVL-XXOS001D

Issued date

2014/04/18

Page

4/9

TA-I TECHNOLOGY CO., LTD

6. Reliability Test

Environmental

Specification

Test Method and Description

High Temperature

Storage/ Dry Heat

The specimen shall be subjected to 125 ± 2℃ for 1000 ± 12 hours in a

thermostatic bath without load and then stored at room temperature and

normal humidity for 1 to 2 hours. The change of varistor voltage shall be within

10 ﹪.

Temperature Cycle

The temperature cycle of specified

temperature shall be repeated five

times and then stored at room

temperature and normal humidity for

one or two hours. The change of

varistor voltage shall be within 10﹪

and mechanical damage shall be

examined.

Step

Temperature

Period

1

-40±3

30Min±3

2

Room

Temperature

1 hour

3

125±3

30Min±3

4

Room

Temperature

1 hours

High Temperature Load

After being continuously applied the maximum allowable voltage at 85 ± 2℃

for 1000± 2 hours, the specimen shall be stored at room temperature and

normal humidity for one or two hours, the change of varistor voltage shall be

within 10﹪.

Damp Heat Load

The specimen should be subjected to 40 ± 2℃, 90 to 95 ﹪RH environment,

and the maximum allowable voltage applied for 1000 hours, then stored at

room temperature and normal humidity for one or two hours. The change of

varistor voltage shall be within 10﹪

Humidity Load

Low Temperature

Storage/ Cold

The specimen should be subjected to -40 ± 2℃, without load for 500 hours

and then stored at room temperature for one or two hours. The change of

varistor voltage shall be within 10 ﹪