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TL16C752BLPTREP Datenblatt(PDF) 1 Page - Texas Instruments

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Teilenummer TL16C752BLPTREP
Bauteilbeschribung  3.3 V DUAL UART WITH 64-BYTE FIFO
Download  40 Pages
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Hersteller  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TL16C752BLPTREP Datenblatt(HTML) 1 Page - Texas Instruments

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RESET
DTRB
DTRA
RTSA
OPA
RXRDYA
INTA
INTB
A0
A1
A2
NC
36
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16
1
2
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D5
D6
D7
RXB
RXA
TXRDYB
TXA
TXB
OPB
CSA
CSB
NC
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PACKAGE
(TOP VIEW)
NC − No internal connection
TL16C752B-EP
www.ti.com
SGLS153B – FEBRUARY 2003 – REVISED DECEMBER 2007
3.3 V DUAL UART WITH 64-BYTE FIFO
Check for Samples: TL16C752B-EP
1
FEATURES
Controlled Baseline
Fast Access Time 2 Clock Cycle IOR/IOW
Pulse Width
One Assembly Site
Programmable Sleep Mode
Test Site
Programmable Serial Interface Characteristics
One Fabrication Site
5-Bit, 6-Bit, 7-Bit, or 8-Bit Characters
Extended Temperature Performance of
–55°C to 110°C and –40°C to 105°C
Even, Odd, or No Parity Bit Generation and
Detection
Enhanced Diminishing Manufacturing Sources
(DMS) Support
1, 1.5, or 2 Stop Bit Generation
Enhanced Product Change Notification
False Start Bit Detection
Qualification Pedigree (1)
Complete Status Reporting Capabilities in
Both Normal and Sleep Mode
Pin Compatible With ST16C2550 With
Additional Enhancements
Line Break Generation and Detection
Up to 1.5-Mbps Baud Rate When Using Crystal
Internal Test and Loopback Capabilities
(24-MHz Input Clock)
Fully Prioritized Interrupt System Controls
Up to 3-Mbps Baud Rate When Using
Modem Control Functions (CTS, RTS, DSR,
Oscillator or Clock Source (48-MHz Input
DTR, RI, and CD)
Clock)
64-Byte Transmit FIFO
64-Byte Receive FIFO With Error Flags
Programmable and Selectable Transmit and
Receive FIFO Trigger Levels for DMA and
Interrupt Generation
Programmable Receive FIFO Trigger Levels for
Software/Hardware Flow Control
Software/Hardware Flow Control
Programmable Xon/Xoff Characters
Programmable Auto-RTS and Auto-CTS
Optional Data Flow Resume by Xon Any
Character
DMA Signaling Capability for Both Received
and Transmitted Data
Supports 3.3-V Operation
Software Selectable Baud Rate Generator
Prescaler Provides Additional Divide By Four
Function
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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