CD40174BMS datasheet(5/8 Pages) INTERSIL

Teilenummer	CD40174BMS

Bauteilbeschribung	CMOS Hex ‘D’-Type Flip-Flop

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Hersteller	INTERSIL [Intersil Corporation]

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Speciﬁcations CD40174BMS

TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS

PARAMETER

SYMBOL

CONDITIONS

NOTES

TEMPERATURE

LIMITS

UNITS

MIN

MAX

Supply Current

IDD

VDD = 20V, VIN = VDD or GND

1, 4

+25oC

-

7.5

µA

N Threshold Voltage

VNTH

VDD = 10V, ISS = -10

µA

1, 4

+25oC

-2.8

-0.2

V

N Threshold Voltage

Delta

∆VTN

VDD = 10V, ISS = -10

µA

1, 4

+25oC-

±1V

P Threshold Voltage

VTP

VSS = 0V, IDD = 10

µA

1, 4

+25oC

0.2

2.8

V

P Threshold Voltage

Delta

∆VTP

VSS = 0V, IDD = 10

µA

1, 4

+25oC-

±1V

Functional

F

VDD = 18V, VIN = VDD or GND

1

+25oC

VOH >

VDD/2

VOL <

VDD/2

V

VDD = 3V, VIN = VDD or GND

Propagation Delay Time

TPHL

TPLH

VDD = 5V

1, 2, 3, 4

+25oC

-

1.35 x

+25oC

Limit

ns

NOTES: 1. All voltages referenced to device GND.

2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.

3. See Table 2 for +25oC limit.

4. Read and Record

TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25OC

PARAMETER

SYMBOL

DELTA LIMIT

Supply Current - MSI-1

IDD

± 0.2µA

Output Current (Sink)

IOL5

± 20% x Pre-Test Reading

Output Current (Source)

IOH5A

± 20% x Pre-Test Reading

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Pre Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

Interim Test 1 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

Interim Test 2 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Interim Test 3 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

Group A

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

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