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74AHC_AHCT132 Datenblatt(PDF) 8 Page - NXP Semiconductors |
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74AHC_AHCT132 Datenblatt(HTML) 8 Page - NXP Semiconductors |
8 / 17 page 74AHC_AHCT132_6 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 06 — 4 May 2009 8 of 17 NXP Semiconductors 74AHC132; 74AHCT132 Quad 2-input NAND Schmitt trigger Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 7. Load circuitry for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74AHC132 VCC ≤ 3.0 ns 50 pF, 15 pF tPLH, tPHL 74AHCT132 3.0 V ≤ 3.0 ns 50 pF, 15 pF tPLH, tPHL |
Ähnliche Teilenummer - 74AHC_AHCT132_15 |
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Ähnliche Beschreibung - 74AHC_AHCT132_15 |
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