Datenblatt-Suchmaschine für elektronische Bauteile |
|
74AHC_AHCT257 Datenblatt(PDF) 11 Page - NXP Semiconductors |
|
74AHC_AHCT257 Datenblatt(HTML) 11 Page - NXP Semiconductors |
11 / 16 page 74AHC_AHCT257_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 9 May 2008 11 of 16 NXP Semiconductors 74AHC257; 74AHCT257 Quad 2-input multiplexer; 3-state Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. RL = load resistance. S1 = test selection switch. Fig 8. Test circuitry for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74AHC257 VCC ≤ 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC 74AHCT257 3.0 V ≤ 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC |
Ähnliche Teilenummer - 74AHC_AHCT257_15 |
|
Ähnliche Beschreibung - 74AHC_AHCT257_15 |
|
|
Link URL |
Privatsphäre und Datenschutz |
ALLDATASHEETDE.COM |
War ALLDATASHEET hilfreich? [ DONATE ] |
Über Alldatasheet | Werbung | Kontakt | Privatsphäre und Datenschutz | Linktausch | Hersteller All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |