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MC74AC352 Datenblatt(PDF) 5 Page - ON Semiconductor

Teilenummer MC74AC352
Bauteilbeschribung  Dual 4?묲nput Multiplexer
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Hersteller  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC74AC352 Datenblatt(HTML) 5 Page - ON Semiconductor

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MC74AC352, MC74ACT352
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5
AC CHARACTERISTICS (For Figures and Waveforms — See Section 3)
Symbol
Parameter
VCC*
(V)
74AC
74AC
Unit
Fig.
No.
TA = +25°C
CL = 50 pF
TA = −40°C
to +85°C
CL = 50 pF
Min
Typ
Max
Min
Max
tPLH
Propagation Delay
Sn to Zn
3.3
2.0
8.5
15.0
1.0
17.5
ns
3-6
5.0
2.0
6.5
11.0
1.0
12.5
tPHL
Propagation Delay
Sn to Zn
3.3
2.0
8.0
14.5
1.0
16.5
ns
3-6
5.0
2.0
6.0
11.0
1.0
12.0
tPLH
Propagation Delay
En to Zn
3.3
2.0
6.0
13.5
1.0
16.0
ns
3-6
5.0
2.0
4.5
9.5
1.0
11.0
tPHL
Propagation Delay
En to Zn
3.3
2.0
5.5
11.0
1.0
12.5
ns
3-6
5.0
2.0
4.0
8.0
1.0
9.0
tPLH
Propagation Delay
In to Zn
3.3
2.0
7.0
12.5
1.0
14.5
ns
3-5
5.0
2.0
5.0
9.0
1.0
10.5
tPHL
Propagation Delay
In to Zn
3.3
2.0
7.0
11.5
1.0
13.0
ns
3-5
5.0
2.0
5.0
8.5
1.0
10.0
* Voltage Range 3.3 V is 3.3 V ±0.3 V.
Voltage Range 5.0 V is 5.0 V ±0.5 V.
DC CHARACTERISTICS
Symbol
Parameter
VCC
(V)
74ACT
74ACT
Unit
Conditions
TA = +25°C
TA =
−40°C to +85°C
Typ
Guaranteed Limits
VIH
Minimum High Level
Input Voltage
4.5
1.5
2.0
2.0
V
VOUT = 0.1 V
5.5
1.5
2.0
2.0
or VCC − 0.1 V
VIL
Maximum Low Level
Input Voltage
4.5
1.5
0.8
0.8
V
VOUT = 0.1 V
5.5
1.5
0.8
0.8
or VCC − 0.1 V
VOH
Minimum High Level
Output Voltage
4.5
4.49
4.4
4.4
V
IOUT = −50 μA
5.5
5.49
5.4
5.4
*VIN = VIL or VIH
4.5
3.86
3.76
V
IOH
−24 mA
5.5
4.86
4.76
−24 mA
VOL
Maximum Low Level
Output Voltage
4.5
0.001
0.1
0.1
V
IOUT = 50 μA
5.5
0.001
0.1
0.1
*VIN = VIL or VIH
4.5
0.36
0.44
V
IOL
24 mA
5.5
0.36
0.44
24 mA
IIN
Maximum Input
Leakage Current
5.5
±0.1
±1.0
μA
VI = VCC, GND
ΔICCT
Additional Max. ICC/Input
5.5
0.6
1.5
mA
VI = VCC − 2.1 V
IOLD
†Minimum Dynamic
Output Current
5.5
75
mA
VOLD = 1.65 V Max
IOHD
5.5
−75
mA
VOHD = 3.85 V Min
ICC
Maximum Quiescent
Supply Current
5.5
8.0
80
μA
VIN = VCC or GND
* All outputs loaded; thresholds on input associated with output under test.
† Maximum test duration 2.0 ms, one output loaded at a time.


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