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MC10125P Datenblatt(PDF) 4 Page - ON Semiconductor

Teilenummer MC10125P
Bauteilbeschribung  Quad MECL to TTL Translator
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Hersteller  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC10125P Datenblatt(HTML) 4 Page - ON Semiconductor

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MC10125
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4
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature
VIHH
VILH
VBB
VCC
VEE
–30
°C –1.890 –2.890
From
+5.0
–5.2
+25
°C –1.810 –2.850
From
Pin
+5.0
–5.2
+85
°C –1.700 –2.825
Pin
1
+5.0
–5.2
Pin
Under
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
Otpt
Characteristic
Symbol
Under
Test
VIHH
VILH
VBB
VCC
VEE
Gnd
Output
Condition
Negative Power Supply
Drain Current
IE
8
3,7,11,15
9
8
16
Positive Power Supply
ICCH
9
3,7,11,15
9
8
16
os
e
o e Su
y
Drain Current
ICCL
9
3,7,11,15
9
8
16
Input Current
IinH1
2
3,7,11,15
9
8
16
Input Leakage Current
ICBO
2
3,7,11,15
9
2,6,8,10,14
16
High Output Voltage
VOH
4
3,7,11,15
9
8
16
–2.0mA
Low Output Voltage
VOL
4
3,7,11,15
9
8
16
20mA
High Threshold Voltage
VOHA
4
3,7,11,15
9
8
16
–2.0mA
Low Threshold Voltage
VOLA
4
3,7,11,15
9
8
16
20mA
Indeterminate Input
Protection Tests
VOLS1
4
9
2,3,6,7,8,
10,11,14,15
16
20mA
VOLS2
4
9
8
16
20mA
Short Circuit Current
IOS
4
3,7,11,15
9
8
4, 16
Reference Voltage
VBB
1
3,7,11,15
Common Mode Rejection Tests
VOH
4
4
3
2
9
9
8
8
16
16
–2.0mA
–2.0mA
VOL
4
4
2
3
9
9
8
8
16
16
20mA
20mA
Switching Times
(50
Ω Load)
Propagation Delay
(50% to +1.5Vdc)
t6+5–
t6–5+
t2+4–
t2–4+
5
5
4
4
3,7,11,15
3,7,11,15
3,7,11,15
3,7,11,15
9
9
9
9
8
8
8
8
16
16
16
16
Rise Time
(+1.0V to 2.0V)
t4+
4
3,7,11,15
9
8
16
Fall Time
(+1.0V to 2.0V)
t4–
4
3,7,11,15
9
8
16
1. Individually test each output, apply VIHmax to pin under test.
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50-ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.


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