Datenblatt-Suchmaschine für elektronische Bauteile |
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LF156MD8 Datenblatt(PDF) 6 Page - Texas Instruments |
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LF156MD8 Datenblatt(HTML) 6 Page - Texas Instruments |
6 / 43 page LF155, LF156, LF256, LF257 LF355, LF356, LF357 SNOSBH0D – MAY 2000 – REVISED NOVEMBER 2015 www.ti.com 6.6 DC Electrical Characteristics, TA = TJ = 25°C, VS = ±15 V PARAMETER TEST CONDITIONS MIN TYP MAX UNIT LF155 2 4 LF355 2 4 Supply current LFx56, LF356B 5 7 mA LF356 5 10 LF357 5 10 6.7 DC Electrical Characteristics See (1) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT LF15x, LF25x, LF356B 3 5 TA = 25°C LF35x 3 10 VOS Input offset voltage RS = 50 Ω LF15x 7 mV Over LF25x, LF356B 6.5 temperature LF35x 13 Average TC of input ΔVOS/ΔT RS = 50 Ω LF15x, LF25x, LF356B, LF35x 5 μV/°C offset voltage Change in average TC μV/°C ΔTC/ΔVOS RS = 50 Ω (2) LF15x, LF25x, LF356B, LF35x 0.5 with VOS adjust per mV LF15x, LF25x, LF356B 3 20 TJ = 25°C (1) (3) pA LF35x 3 50 IOS Input offset current LF15x 20 TJ ≤ THIGH LF25x, LF356B 1 nA LF35x 2 LF15x, LF25x, LF356B 30 100 TJ = 25°C (1) (3) pA LF35x 30 200 IB Input bias current LF15x 50 TJ ≤ THIGH LF25x, LF356B 5 nA LF35x 8 RIN Input resistance TJ = 25°C LF15x, LF25x, LF356B, LF35x Ω 1012 LF15x, LF25x, LF356B 50 200 TA = 25°C VS = ±15 V, LF35x 25 200 AVOL Large signal voltage gain VO = ±10 V, V/mV LF15x, LF25x, LF356B 25 Over RL = 2 kΩ temperature LF35x 15 VS = ±15 V, RL = 10 kΩ LF15x, LF25x, LF356B, LF35x ±12 ±13 VO Output voltage swing V VS = ±15 V, RL= 2 kΩ LF15x, LF25x, LF356B, LF35x ±10 ±12 (1) Unless otherwise stated, these test conditions apply: LF15x LF25x LF356B LF35x Supply Voltage, VS ±15 V ≤ VS ≤ ±20 V ±15 V ≤ VS ≤ ±20 V ±15 V ≤ VS ≤ ±20 V VS = ±15 V TA −55°C ≤ TA ≤ +125°C −25°C ≤ TA ≤ +85°C 0°C ≤ TA ≤ +70°C 0°C ≤ TA ≤ +70°C THIGH +125°C +85°C +70°C +70°C and VOS, IB and IOS are measured at VCM = 0. (2) The Temperature Coefficient of the adjusted input offset voltage changes only a small amount (0.5 μV/°C typically) for each mV of adjustment from its original unadjusted value. Common-mode rejection and open-loop voltage gain are also unaffected by offset adjustment. (3) The input bias currents are junction leakage currents which approximately double for every 10°C increase in the junction temperature, TJ. Due to limited production test time, the input bias currents measured are correlated to junction temperature. In normal operation the junction temperature rises above the ambient temperature as a result of internal power dissipation, Pd. TJ = TA + θJA Pd where θJA is the thermal resistance from junction to ambient. Use of a heat sink is recommended if input bias current is to be kept to a minimum. 6 Submit Documentation Feedback Copyright © 2000–2015, Texas Instruments Incorporated LF156 LF256 LF356 |
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