Datenblatt-Suchmaschine für elektronische Bauteile |
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LF147JAN Datenblatt(PDF) 3 Page - Texas Instruments |
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LF147JAN Datenblatt(HTML) 3 Page - Texas Instruments |
3 / 18 page LF147JAN www.ti.com SNOSAJ9A – APRIL 2005 – REVISED MARCH 2013 Absolute Maximum Ratings (1) Supply Voltage ±18V Differential Input Voltage ±30V Input Voltage Range(2) ±15V Output Short Circuit Duration(3) Continuous Power Dissipation(4)(5) 900 mW TJ max 150°C θJA CDIP 70°C/W Operating Temperature Range −55°C ≤ TA ≤ 125°C Storage Temperature Range −65°C ≤ TA ≤ 150°C Lead Temperature (Soldering, 10 sec.) 260°C ESD(6) 900V (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) Unless otherwise specified the absolute maximum negative input voltage is equal to the negative power supply voltage. (3) Any of the amplifier outputs can be shorted to ground indefinitely, however, more than one should not be simultaneously shorted as the maximum junction temperature will be exceeded. (4) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (Package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax — TA) / θJA or the number given in the Absolute Maximum Ratings, whichever is lower. (5) Max. Power Dissipation is defined by the package characteristics. Operating the part near the Max. Power Dissipation may cause the part to operate outside specified limits. (6) Human body model, 1.5 k Ω in series with 100 pF. Recommended Operating Conditions Supply Voltage Range ±5V to ±15V Quality Conformance Inspection Mil-Std-883, Method 5005 - Group A Subgroup Description Temp (°C) 1 Static tests at 25 2 Static tests at 125 3 Static tests at -55 4 Dynamic tests at 25 5 Dynamic tests at 125 6 Dynamic tests at -55 7 Functional tests at 25 8A Functional tests at 125 8B Functional tests at -55 9 Switching tests at 25 10 Switching tests at 125 11 Switching tests at -55 12 Settling Time at 25 Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LF147JAN |
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