LF156JAN

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SNOSAQ0A – MARCH 2006 – REVISED MARCH 2013

LF156JAN JFET Input Operational Amplifiers

Check for Samples: LF156JAN

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FEATURES

COMMON FEATURES

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•

Advantages

•

Low Input Bias Current: 30pA

–

Replace Expensive Hybrid and Module FET

•

Low Input Offset Current: 3pA

Op Amps

•

Ω

–

Rugged JFETs Allow Blow-Out Free

•

Low Input Noise Current: 0.01 pA /

√Hz

Handling Compared with MOSFET Input

•

High Common-Mode Rejection Ratio: 100 dB

Devices

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Large DC Voltage Gain: 106 dB

–

Excellent for Low Noise Applications using

either High or Low Source

UNCOMMON FEATURES

Impedance—Very Low 1/f Corner

•

Extremely Fast Settling Time to 0.01% 1.5

μs

–

Offset Adjust does not Degrade Drift or

•

Fast Slew Rate 12V/µs

Common-Mode Rejection as in Most

•

Wide Gain Bandwidth 5MHz

Monolithic Amplifiers

•

Low Input Noise Voltage 12 nV /

√Hz

–

New Output Stage Allows use of Large

Capacitive Loads (5,000 pF) without

DESCRIPTION

Stability Problems

This is the first monolithic JFET input operational

–

Internal Compensation and Large

amplifier to incorporate well matched, high voltage

Differential Input Voltage Capability

JFETs on the same chip with standard bipolar

transistors (BI-FET™ Technology). This amplifier

APPLICATIONS

features low input bias and offset currents/low offset

•

Precision High Speed Integrators

voltage and offset voltage drift, coupled with offset

adjust which does not degrade drift or common-mode

•

Fast D/A and A/D Converters

rejection. The device is also designed for high slew

•

High Impedance Buffers

rate, wide bandwidth, extremely fast settling time, low

•

Wideband, Low Noise, Low Drift Amplifiers

voltage and current noise and a low 1/ƒ noise corner.

•

Logarithmic Amplifiers

•

Photocell Amplifiers

•

Sample and Hold Circuits

Connection Diagrams

Figure 1. Top View

Metal Can Package (LMC)

See Package LMC0008C

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PRODUCTION DATA information is current as of publication date.

Copyright © 2006–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.