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LM10QML Datenblatt(PDF) 3 Page - Texas Instruments

Teilenummer LM10QML
Bauteilbeschribung  Operational Amplifier and Voltage Reference
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Hersteller  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
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LM10QML Datenblatt(HTML) 3 Page - Texas Instruments

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LM10QML
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SNOSAP1A – OCTOBER 2010 – REVISED MARCH 2013
Absolute Maximum Ratings
(1)
Total Supply Voltage
45V
Differential Input Voltage (2)
±40V
Power Dissipation (PDmax)
(3)
Internally Limited
Output Short-circuit Duration (4)
Continuous
Storage Temperature Range
−55°C ≤ TA ≤ +150°C
Maximum Junction Temperature (TJmax)
150°C
Lead Temperature
(Soldering 10 seconds)
300°C
Thermal Resistance
θJA
Still Air
150°C
500LF/Min Air flow
45°C
θJC
45°C
ESD
Rating to be determined
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
The Input voltage can exceed the supply voltages provided that the voltage from the input to any other terminal does not exceed the
maximum differential input voltage and excess dissipation is accounted for when VI< VS
-.
(3)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower..
(4)
Internal thermal limiting prevents excessive heating that could result in sudden failure, but the IC can be subjected to accelerated stress
with a shorted output and worst-case conditions.
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp °C
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
12
Settling time at
+25
13
Settling time at
+125
14
Settling time at
-55
Copyright © 2010–2013, Texas Instruments Incorporated
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