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MC10E1651 Datenblatt(PDF) 6 Page - ON Semiconductor |
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MC10E1651 Datenblatt(HTML) 6 Page - ON Semiconductor |
6 / 9 page MC10E1651 http://onsemi.com 6 DELAY DISPERSION Under a constant set of input conditions comparators have a specified nominal propagation delay. However, since propagation delay is a function of input slew rate and input voltage overdrive the delay dispersion parameters, TDE and TDT, are provided to allow the user to adjust for these variables (where TDE and TDT apply to inputs with standard ECL and TTL levels, respectively). Figure 4 and Figure 5 define a range of input conditions which incorporate varying input slew rates and input voltage overdrive. For input parameters that adhere to these constraints the propagation delay can be described as: TNOM ± TDE (or TDT) where TNOM is the nominal propagation delay. TNOM accounts for nonuniformity introduced by temperature and voltage variability, whereas the delay dispersion parameter takes into consideration input slew rate and input voltage overdrive variability. Thus a modified propagation delay can be approximated to account for the effects of input conditions that differ from those under which the parts where tested. For example, an application may specify an ECL input with a slew rate of 0.25 V/NS, an overdrive of 17 mV and a temperature of 25 °C, the delay dispersion parameter would be 100 ps. The modified propagation delay would be 775 ps ± 100 ps Figure 4. ECL Dispersion Test Input Conditions Figure 5. TTL Dispersion Test Input Conditions 0 V 0.5 V 2.0 V 2.5 V - 1.75 V - 1.58 V - 1.07 V -0.9 V SLEW RATE = 0.75 V/NS SLEW RATE = 0.75 V/NS SLEW RATE = 0.25 V/NS SLEW RATE = 0.30 V/NS INPUT THRESHOLD RANGE INPUT THRESHOLD RANGE |
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