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MC10E1651 Datenblatt(PDF) 6 Page - ON Semiconductor

Teilenummer MC10E1651
Bauteilbeschribung  Dual ECL Output Comparator with Latch
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Hersteller  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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MC10E1651
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6
DELAY DISPERSION
Under a constant set of input conditions comparators have
a specified nominal propagation delay. However, since
propagation delay is a function of input slew rate and input
voltage overdrive the delay dispersion parameters, TDE and
TDT, are provided to allow the user to adjust for these
variables (where TDE and TDT apply to inputs with standard
ECL and TTL levels, respectively).
Figure 4 and Figure 5 define a range of input conditions
which incorporate varying input slew rates and input voltage
overdrive. For input parameters that adhere to these
constraints the propagation delay can be described as:
TNOM ± TDE (or TDT)
where TNOM is the nominal propagation delay. TNOM
accounts for nonuniformity introduced by temperature and
voltage variability, whereas the delay dispersion parameter
takes into consideration input slew rate and input voltage
overdrive variability. Thus a modified propagation delay can
be approximated to account for the effects of input conditions
that differ from those under which the parts where tested. For
example, an application may specify an ECL input with a
slew rate of 0.25 V/NS, an overdrive of 17 mV and a
temperature of 25
°C, the delay dispersion parameter would
be 100 ps. The modified propagation delay would be
775 ps
± 100 ps
Figure 4. ECL Dispersion Test Input Conditions
Figure 5. TTL Dispersion Test Input Conditions
0 V
0.5 V
2.0 V
2.5 V
- 1.75 V
- 1.58 V
- 1.07 V
-0.9 V
SLEW RATE = 0.75 V/NS
SLEW RATE = 0.75 V/NS
SLEW RATE =
0.25 V/NS
SLEW RATE =
0.30 V/NS
INPUT
THRESHOLD
RANGE
INPUT
THRESHOLD
RANGE


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