Datenblatt-Suchmaschine für elektronische Bauteile |
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MC10E111FNG Datenblatt(PDF) 6 Page - ON Semiconductor |
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MC10E111FNG Datenblatt(HTML) 6 Page - ON Semiconductor |
6 / 9 page MC10E111, MC100E111 www.onsemi.com 6 Table 7. AC CHARACTERISTICS (VCCx = 5.0 V; VEE= 0.0 V or VCCx = 0.0 V; VEE= −5.0 V (Note 1)) Symbol Unit 85°C 25°C −40°C Characteristic Symbol Unit Max Typ Min Max Typ Min Max Typ Min Characteristic tskew Within-Device Skew (Note 8) 25 75 25 50 25 50 ps tJITTER Random Clock Jitter (RMS) <1 <2 <1 <2 <1 <2 ps VPP Minimum Input Swing 50 50 50 mV tr, tf Rise/Fall Time 250 450 650 275 375 600 275 375 600 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 1. 10 Series: VEE can vary −0.46 V / +0.06 V. 100 Series: VEE can vary −0.46 / +0.8 V. 2. The differential propagation delay is defined as the delay from the crossing points of the differential input signals to the crossing point of the differential output signals. 3. The single-ended propagation delay is defined as the delay from the 50% point of the input signal to the 50% point of the output signal. 4. Enable is defined as the propagation delay from the 50% point of a negative transition on EN to the 50% point of a positive transition on Q (or a negative transition on Q). Disable is defined as the propagation delay from the 50% point of a positive transition on EN to the 50% point of a negative transition on Q (or a positive transition on Q). 5. The setup time is the minimum time that EN must be asserted prior to the next transition of IN/IN to prevent an output response greater than $75 mV to that IN/IN transition (Figure 3). 6. The hold time is the minimum time that EN must remain asserted after a negative going IN or a positive going IN to prevent an output response greater than $75 mV to that IN/IN transition (Figure 4). 7. The release time is the minimum time that EN must be deasserted prior to the next IN/IN transition to ensure an output response that meets the specified IN to Q propagation delay and output transition times (Figure 5). 8. The within-device skew is defined as the worst case difference between any two similar delay paths within a single device. Figure 3. Setup Time ts IN IN EN Q ≤ 75mV ≤ 75mV Q ≤ 75mV ≤ 75mV Figure 4. Hold Time th IN IN EN Q Q Figure 5. Release Time tr IN IN EN 50% Q Q 50% 50% |
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