SN74AC04EP

HEX INVERTER

SCAS717 − OCTOBER 2003

1

POST OFFICE BOX 655303

− One Assembly/Test Site, One Fabrication

Site

−55

°C to 125°C

Sources (DMS) Support

† Component qualification in accordance with JEDEC and industry

standards to ensure reliable operation over an extended

temperature range. This includes, but is not limited to, Highly

Accelerated Stress Test (HAST) or biased 85/85, temperature

cycle, autoclave or unbiased HAST, electromigration, bond

intermetallic life, and mold compound life. Such qualification

testing should not be viewed as justifying use of this component

beyond specified performance and environmental limits.

description/ordering information

The SN74AC04 contains six independent inverters. The device performs the Boolean function Y = A.

ORDERING INFORMATION

TA

PACKAGE‡

ORDERABLE

PART NUMBER

TOP-SIDE

MARKING

−55

°C to 125°C

SOIC − D

Tape and reel

SN74AC04MDREP

SAC04MEP

‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are

available at www.ti.com/sc/package.

FUNCTION TABLE

(each inverter)

INPUT

OUTPUT

INPUT

A

OUTPUT

Y

H

L

L

H

logic diagram, each inverter (positive logic)

Y

A

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1Y

2A

2Y

3A

3Y

GND

6A

6Y

5A

5Y

4A

4Y

D PACKAGE

(TOP VIEW)

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

Copyright

 2003, Texas Instruments Incorporated

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.