Datenblatt-Suchmaschine für elektronische Bauteile |
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MC100LVEP210 Datenblatt(PDF) 6 Page - ON Semiconductor |
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MC100LVEP210 Datenblatt(HTML) 6 Page - ON Semiconductor |
6 / 9 page MC100LVEP210 http://onsemi.com 6 Table 8. AC CHARACTERISTICS VCC = 0 V; VEE = −2.375 to −3.8 V or VCC = 2.375 to 3.8 V; VEE = 0 V (Note 13) Symbol Characteristic −40 °C 25 °C 85 °C Unit Min Typ Max Min Typ Max Min Typ Max fmaxPECL/ HSTL Maximum Frequency (Figure 4) 3 3 3 GHz tPLH/tPHL Propagation Delay @ 2.5 V Propagation Delay @ 3.3 V 220 220 300 300 380 380 270 270 350 350 430 430 300 330 400 410 500 490 ps tskew Within−Device Skew (Note 14) Device−to−Device Skew (Note 15) 20 85 25 160 20 85 25 160 20 85 35 160 ps tJITTER CLOCK Random Jitter (RMS) @ v0.5 GHz @ v1.0 GHz @ v1.5 GHz @ v2.0 GHz @ v2.5 GHz @ v3.0 GHz 0.184 0.190 0.178 0.196 0.239 0.336 0.3 0.3 0.3 0.3 0.4 0.5 0.207 0.200 0.197 0.233 0.301 0.422 0.3 0.3 0.3 0.4 0.4 0.5 0.271 0.252 0.259 0.308 0.399 0.572 0.4 0.4 0.4 0.5 0.5 0.9 ps VPP Minimum Input Swing 150 800 1200 150 800 1200 150 800 1200 mV tr/tf Output Rise/Fall Time (20%−80%) 100 170 250 120 190 270 150 280 350 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 13. Measured with 750 mV source, 50% duty cycle clock source. All loading with 50 W to VCC − 2.0 V. 14. Skew is measured between outputs under identical transitions of similar paths through a device. 15. Device−to−Device skew for identical transitions at identical VCC levels. 0 100 200 300 400 500 600 700 800 0 1000 2000 3000 4000 5000 6000 Figure 4. Fmax Typical FREQUENCY (MHz) |
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