Datenblatt-Suchmaschine für elektronische Bauteile |
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GS7005-CTT Datenblatt(PDF) 3 Page - Gennum Corporation |
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GS7005-CTT Datenblatt(HTML) 3 Page - Gennum Corporation |
3 / 12 page GENNUM CORPORATION 522 - 14 - 06 3 AC ELECTRICAL CHARACTERISTICS VCC = 5V, TA = 25°C, unless otherwise specified in ‘conditions’ Serial data rate = 270Mb/s, Parallel Data Rate = 27Mb/s, ƒPCLK = 27MHz PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTE S TEST LEVEL Parallel Data - Rise/Fall Time tR/F_DOUT CL = 20pF 1.0 - 6.0 ns 1 4, 7 PCLK Rising Edge to DOUT(N) Centre tD - - ±5 ns 2, 3 4, 7 PCLK Rise/Fall Time tR/F_PCLKOUT CL = 20pF 0.5 - 3.0 ns 1 4, 7 Input Return Loss LOSSIN 75 Ω match 5MHz to 270MHz -17 - dB 7 Asynchronous Lock Time tLOCK_ASYNC - - 250 ms 4 1 Synchronous Lock Time tLOCK_SYNC - - 10 µs 5 1 Input Jitter Tolerance tJ_SI Pathological Input - 0.35 - U.I. 6 7 Output PCLK Jitter tJ_PCLKOUT Pseudorandom Input - 800 - ps p-p 1 Pathological Input - 1000 - ps p-p 6 7 Error Free Cable Length Pseudorandom Input - 100 - m 7 Pathological Input 75 100 - m 6, 7 1 NOTES 1. Rise/Fall time is defined as the time for the signal to rise from 20% to 80% of the specified p-p value, or to fall from 80% to 20% of the specified value. 2. Refer also to Figure 10. 3. This is the time difference between the rising edge of PCLKOUT and the centre of the bit period. 4. This is the time delay between a valid serial TRS signal on the input to the moment valid data appears on the parallel outputs. 5. This is the time for the PLL to re-lock when video streams are switched during the vertical blanking interval in accordance with SMPTE RP168-1993. The two streams may be 180° out of phase with respect to one another, but pixel aligned. 6. This pathological pattern is defined in SMPTE RP178-1996, paragraphs 4.1 and 4.3. 7. "Error free" is defined as no single bit errors over a period of 10 minutes, using Belden 8281 Cable and 75 Ω connections. The MIN value is fully tested and the TYP value is based on using the EB7005 Evaluation Board. TEST LEVELS 1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges. 2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using correlated test. 3. Production test at room temperature and nominal supply voltage. 4. QA sample test. 5. Calculated result based on Level 1,2, or 3. 6. Not tested. Guaranteed by design simulations. 7. Not tested. Based on characterization of nominal parts. 8. Not tested. Based on existing design/characterization data of similar product. |
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Ähnliche Beschreibung - GS7005-CTT |
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