Datenblatt-Suchmaschine für elektronische Bauteile |
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AD5530 Datenblatt(PDF) 3 Page - Analog Devices |
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AD5530 Datenblatt(HTML) 3 Page - Analog Devices |
3 / 16 page REV. 0 AD5530/AD5531 –3– Parameter AD5530 AD5531 Unit Test Conditions/Comments ACCURACY Resolution 12 14 Bits Relative Accuracy ±1 ±2LSB max Differential Nonlinearity ±1 ±1 LSB max Guaranteed Monotonic Over Temperature Zero-Scale Error ±2 ±8 LSB max Typically within ±1 LSB Full-Scale Error ±2 ±8 LSB max Typically within ±1 LSB Gain Error ±1 ±4 LSB typ Gain Temperature Coefficient 2 0.5 0.5 ppm FSR/ °C typ 10 10 ppm FSR/ °C max REFERENCE INPUTS 2 Reference Input Range 0/4.096 0/4.096 V min/V max Max Output Range ±8.192 V DC Input Resistance 100 100 M Ω typ Input Current ±1 ±1 µA max Per Input. Typically ±20 nA. DUTGND INPUT 2 DC Input Impedance 60 60 k Ω typ Max Input Current ±0.3 ±0.3 mA typ Input Range –3/+3 –3/+3 V min/V max Max Output Range ±8.192 V O/P CHARACTERISTICS2 Output Voltage Swing ±8.192 ±8.192 V max Short Circuit Current 15 15 mA max Resistive Load 5 5 k Ω min To 0 V Capacitive Load 1200 1200 pF max To 0 V DC Output Impedance 0.5 0.5 Ω max DIGITAL I/O VINH, Input High Voltage 2.4 2.4 V min VINL, Input Low Voltage 0.8 0.8 V max IINH, Input Current ±10 ±10 µA max Total for All Pins CIN, Input Capacitance 2 10 10 pF max 3 pF Typ SDO VOL Output Low Voltage 0.4 0.4 V max ISINK = 1 mA POWER REQUIREMENTS VDD /VSS +12/–12 +12/–12 V nom ±10% For Specified Performance Power Supply Sensitivity ∆Full Scale/∆VDD 110 110 dB typ ∆Full Scale/∆V SS 100 100 dB typ IDD 2 2 mA max Outputs Unloaded ISS 2 2 mA max Outputs Unloaded IDD in Power-Down 150 150 µA max Typically 50 µA NOTES 1Temperature range for B Version: –40 °C to +85°C. 2Guaranteed by design, not subject to production test. Specifications subject to change without notice. AC PERFORMANCE CHARACTERISTICS Parameter A Unit Test Conditions/Comments DYNAMIC PERFORMANCE Output Voltage Settling Time 20 µs typ Full-Scale Change to ±1/2 LSB. DAC Latch Contents alternately loaded with all 0s and all 1s. Slew Rate 1.3 V/ µs typ Digital-to-Analog Glitch Impulse 120 nV-s typ DAC Latch alternately loaded with 0FFF Hex and 1000 Hex. Not dependent on load conditions. Digital Feedthrough 0.5 nV-s typ Effect of Input Bus Activity on DAC Output Under Test Output Noise Spectral Density @ 1 kHz 100 nV/(Hz) 1/2typ All 1s Loaded to DAC Specifications subject to change without notice. Guaranteed by design, not subject to production test. SPECIFICATIONS1 (V DD = +12 V ±10%; V SS = –12 V ±10%; GND = 0 V; RL = 5 k Ω and CL = 220 pF to GND; TA = TMIN to TMAX, unless otherwise noted.) (VDD = 10.8 V to 16.5 V, VSS = –10.8 V to –16.5 V; GND = 0 V; RL = 5 k Ω and CL = 220 pF to GND. All specifications TMIN to TMAX, unless otherwise noted.) |
Ähnliche Teilenummer - AD5530 |
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Ähnliche Beschreibung - AD5530 |
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