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CY7C1618KV18 Datenblatt(PDF) 17 Page - Cypress Semiconductor |
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CY7C1618KV18 Datenblatt(HTML) 17 Page - Cypress Semiconductor |
17 / 32 page Document Number: 001-44274 Rev. *N Page 17 of 32 CY7C1618KV18/CY7C1620KV18 TAP Timing and Test Conditions Figure 3 shows the TAP timing and test conditions. [18] Figure 3. TAP Timing and Test Conditions tTL tTH (a) TDO CL = 20 pF Z0 = 50 GND 0.9 V 50 1.8 V 0 V ALL INPUT PULSES 0.9 V Test Clock Test Mode Select TCK TMS Test Data In TDI Test Data Out tTCYC tTMSH tTMSS tTDIS tTDIH tTDOV tTDOX TDO Note 18. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns. |
Ähnliche Teilenummer - CY7C1618KV18 |
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Ähnliche Beschreibung - CY7C1618KV18 |
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