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DAC8814IBDBR Datenblatt(PDF) 2 Page - Texas Instruments

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Teilenummer DAC8814IBDBR
Bauteilbeschribung  Quad, Serial Input 16-Bit Multiplying Digital-to-Analog Converter
Download  31 Pages
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Hersteller  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

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ABSOLUTE MAXIMUM RATINGS
(1)
DAC8814
SBAS338 – JANUARY 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION(1)
MINIMUM
RELATIVE
DIFFERENTIAL
SPECIFIED
TRANSPORT
ACCURACY
NONLINEARITY
TEMPERATURE
PACKAGE-
PACKAGE
ORDERING
MEDIA,
PRODUCT
(LSB)
(LSB)
RANGE
LEAD
DESIGNATOR
NUMBER
QUANTITY
DAC8814ICDBT
Tape and Reel, 250
DAC8814C
±1
±1
-40
°C to +85°C
SSOP-28
DB
DAC8814ICDBR
Tape and Reel, 2500
DAC8814IBDBT
Tape and Reel, 250
DAC8814B
±4
±1.5
-40
°C to +85°C
SSOP-28
DB
DAC8814IBDBR
Tape and Reel, 2500
(1)
For the most current specifications and package information, see the Package Option Addendum located at the end of this data sheet or
refer to our web site at www.ti.com.
DAC8814
UNIT
VDD to GND
-0.3 to +8
V
VSS to GND
-0.3 to -7
V
VREF to GND
-18 to +18
V
Logic inputs and output to GND
-0.3 to + 8
V
V(IOUT) to GND
-0.3 to VDD + 0.3
V
AGNDX to DGND
-0.3 to +0.3
V
Input current to any pin except supplies
±50
mA
Package power dissipation
(TJmax - TA)/θJA
Thermal resistance,
θ
JA
28-Lead shrink surface-mount (RS-28)
100
°C/W
Maximum junction temperature (TJmax)
150
°C
Operating temperature range, Model A
-40 to +85
°C
Storage temperature range
-65 to + 150
°C
Lead temperature
RS-28 (Vapor phase 60s)
215
°C
RS-28 (Infrared 15s)
220
°C
(1)
Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. This is a stress rating only;
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum conditions for extended periods may affect device reliability.
2


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