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CAT25C09U14-TE13 Datenblatt(PDF) 2 Page - Catalyst Semiconductor |
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CAT25C09U14-TE13 Datenblatt(HTML) 2 Page - Catalyst Semiconductor |
2 / 12 page 2 CAT25C11/03/05/09/17 Doc. No. 1017, Rev. J D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +6.0V, unless otherwise specified. Limits Symbol Parameter Min. Typ. Max. Units Test Conditions ICC1 Power Supply Current 5 mA VCC = 5V @ 5MHz (Operating Write) SO=open; CS=Vss ICC2 Power Supply Current 3 mA VCC = 5.5V (Operating Read) FCLK = 5MHz ISB(6) Power Supply Current 1 µA CS = VCC (Standby) VIN = VSS or VCC ILI Input Leakage Current 2 µA ILO Output Leakage Current 3 µAVOUT = 0V to VCC, CS = 0V VIL(5) Input Low Voltage -1 VCC x 0.3 V VIH(5) Input High Voltage VCC x 0.7 VCC + 0.5 V VOL1 Output Low Voltage 0.4 V VOH1 Output High Voltage VCC - 0.8 V VOL2 Output Low Voltage 0.2 V 1.8V ≤VCC<2.7V VOH2 Output High Voltage VCC-0.2 V IOL = 150 µA IOH = -100 µA ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –55 °C to +125°C Storage Temperature ....................... –65 °C to +150°C Voltage on any Pin with Respect to VSS(1) .................. –2.0V to +VCC +2.0V VCC with Respect to VSS ................................ –2.0V to +7.0V Package Power Dissipation Capability (Ta = 25 °C)................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300 °C Output Short Circuit Current(2) ........................ 100 mA *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specifica- tion is not implied. Exposure to any absolute maximum rating for extended periods may affect device perfor- mance and reliability. RELIABILITY CHARACTERISTICS Symbol Parameter Min. Max. Units Reference Test Method NEND(3) Endurance 1,000,000 Cycles/Byte MIL-STD-883, Test Method 1033 TDR(3) Data Retention 100 Years MIL-STD-883, Test Method 1008 VZAP(3) ESD Susceptibility 2000 Volts MIL-STD-883, Test Method 3015 ILTH(3)(4) Latch-Up 100 mA JEDEC Standard 17 Note: (1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns. (2) Output shorted for no more than one second. No more than one output shorted at a time. (3) This parameter is tested initially and after a design or process change that affects the parameter. (4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V. (5) VILMIN and VIHMAX are reference values only and are not tested. (6) Maximum standby current (ISB ) = 10µA for the Automotive and Extended Automotive temperature range. 2.7V ≤VCC<5.5V IOL = 3.0mA IOH = -1.6mA |
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Ähnliche Beschreibung - CAT25C09U14-TE13 |
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