Datenblatt-Suchmaschine für elektronische Bauteile |
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A19A-W2SS1612-C8 Datenblatt(PDF) 16 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
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A19A-W2SS1612-C8 Datenblatt(HTML) 16 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
16 / 23 page REFOND:WI-E-045 A/3 REV:E/1 Tel: +86-755-66839118 Fax:+86-755-66839300 E-mail:sales@refond.com Web: www.refond.com PAGE:16 TG-201712120857EP 2.3 Cardboard Box Fig.2-4 Cardboard Box 2.4 Reliability Test Items And Conditions Table 2-3 Reliability Test Items And Conditions Test Items Ref.Standard Test Condition Time Quantity Ac/Re / Thermal Shock JESD22-A106 -40 15min ↑↓10sec 100 15min 100 cycle 10pcs. 0/1 High Temperature Storage JESD22-A103 Temp:100 1000hrs. 10pcs. 0/1 Low Temperature Storage JESD22-A119 Temp:-40 1000hrs. 10pcs. 0/1 Life Test JESD22-A108 Tc=65 Ta=25 IF=450mA 1000hrs. 10pcs. 0/1 深圳市瑞丰光电子股份有限公司 SHENZHEN REFOND OPTOELECTRONICS CO.LTO. |
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