Datenblatt-Suchmaschine für elektronische Bauteile |
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FQP3N80C Datenblatt(PDF) 6 Page - Fairchild Semiconductor |
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FQP3N80C Datenblatt(HTML) 6 Page - Fairchild Semiconductor |
6 / 10 page Rev. A, April 2003 ©2003 Fairchild Semiconductor Corporation Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms Charge V GS 10V Q g Q gs Q gd 3mA V GS DUT V DS 300nF 50KΩ 200nF 12V Same Type as DUT Charge V GS 10V Q g Q gs Q gd 3mA V GS DUT V DS 300nF 50KΩ 200nF 12V Same Type as DUT V GS V DS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V V DS R L DUT R G V GS V GS V DS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V V DS R L DUT R G V GS EAS =L IAS 2 ---- 2 1 -------------------- BVDSS -VDD BV DSS VDD V DS BV DSS t p V DD I AS V DS (t) ID (t) Time 10V DUT RG L I D t p EAS =L IAS 2 ---- 2 1 EAS =L IAS 2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BV DSS VDD V DS BV DSS t p V DD I AS V DS (t) ID (t) Time 10V DUT RG L L I D I D t p |
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