Datenblatt-Suchmaschine für elektronische Bauteile |
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TLP106 Datenblatt(PDF) 5 Page - Toshiba Semiconductor |
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TLP106 Datenblatt(HTML) 5 Page - Toshiba Semiconductor |
5 / 8 page TLP106 5 2003-10-20 TEST CIRCUIT 2:Common Mode Transient Immunity Test circuit VOL Test Circuit VOH Test Circuit IOSL Test Circuit IOSH Test Circuit VCC GND SHIELD 0.1uF VO VCC SW IF 1 3 6 5 4 VCM A B → VCM 10% 90% 1000V CMH= ・SW A : IF=5mA ・ SW B : IF=0mA 1V 17V CML V O 800(V) tf(us) CMH CML= 800(V) tr(us) tr tf VCC GND SHIELD 0.1uF VOL VCC 1 3 6 5 4 V IOL ↑ VCC GND SHIELD 0.1uF VOH VCC IF 1 3 6 5 4 → V IOH ↑ ↑ VCC GND SHIELD 0.1uF VO VCC 1 3 6 5 4 ← IOSL A VCC GND SHIELD 0.1uF VCC IF 1 3 6 5 4 → → IOSH ↑ A VO |
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