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GJ221B Datenblatt(PDF) 3 Page - Murata Manufacturing Co., Ltd.

Teilenummer GJ221B
Bauteilbeschribung  Chip Monolithic Ceramic Capacitors
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Hersteller  MURATA [Murata Manufacturing Co., Ltd.]
Direct Link  http://www.murata.com
Logo MURATA - Murata Manufacturing Co., Ltd.

GJ221B Datenblatt(HTML) 3 Page - Murata Manufacturing Co., Ltd.

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Please read CAUTION and Notice in this catalog for safety. This catalog has only typical specifications. Therefore you are requested
to approve our product specification or to transact the approval sheet for product specification, before your ordering.
C02E8.pdf 01.7.26
No.
Item
Specification
Test Method
12
Solder the capacitor to the test jig (glass epoxy boards) shown
in Fig.2 using a eutectic solder. Then apply a force in the direc-
tion shown in Fig.3 for 5±1 sec. The soldering shall be done
either with an iron or using the reflow method and shall be con-
ducted with care so that the soldering is uniform and free of
defects such as heat shock.
Continued from the preceding page.
Continued on the following page.
Deflection
No cracks or marking defects shall occur.
13
Immerse the capacitor first ethanol (JIS-K-8101)a solution of
rosin (JIS-K-5902) (25% rosin in weight proportion), then in an
eutectic solder solution for 2±0.5 seconds at 230±5°C after pre-
heating in the following table. then set it for 48±4 hours at room
temperature and measure.
The capacitor shall be set for 48±4 hours at room temperature
after one hour heat of treatment at 150.
°C.
Immerse the capacitor in a eutectic solder solution at 270± 5°C
for 10±0.5 seconds after preheating in the flowing table. Then
set it for 48T4 hours at room temperature and measure.
Solderability of
Termination
75% of the terminations is to be soldered evenly and continu-
ously.
14
Resistance to
Soldering Heat
The measured values shall satisfy the values in the following
table.
Specifications and Test Methods
b
a
100
t=1.6mm
ø4.5
Fig.2
Capacitance meter
Flexure :
V1
20 50
R230
Pressurizing
speed : 1.0mm/sec.
Pressurize
45
45
Fig.3
+0
–10
The capacitor shall be set for 48±4 hours at room temperature
after one hour heat of treatment at 150
°C.
Then measure for the initial measurement. Fix capacitor to the
supporting jig in the same manner and under the same condi-
tions as in (10) and conduct the five cycles according to the
temperature and time shown in the following table.
Set it for 48±4 hours at room temperature, then measure.
15
Temperature
Cycle
No marking defects.
+0
–10
Set the capacitor for 500±12 hours at 40±2°C and 90 to 95%
humidity. Take it out and set it for 48T4 hours at room tempera-
ture, then measure.
16
Humidity
Steady State
No marking defects.
Apply the rated voltage for 500±12 hours at 40±2°C and 90 to
95% humidity and set it for 48±4 hours at room temperature,
then measure. The charge/discharge current is less than
50mA.
17
Humidity
Load
No marking defects.
Step
Temp. (ºC)
Time (min.)
1
Min. Operating
Temp.aaa
30
T3
2
4
Room
Temp.
2 to 3
Room
Temp.
2 to 3
3
Max. Operating
Temp.aaa
30
T3
+3
- 0
+3
- 0
Type
GJ218
GJ221
GJ231
GJ232
GJ243
1.0
1.2
2.2
2.2
3.5
a
3.0
4.0
5.0
5.0
7.0
b
1.2
1.65
2.0
2.9
3.7
c
(in mm)
Item
Appearance
Capacitance Change
I. R.
D.F.
Dielectric Strength
No marked defect
Within
T20%
More than 10,000M
Ω or 500Ω · F
(Whichever is smaller)
50, 100V
10, 16, 25V
6.3V
0.07 max.
0.09 max.
0.15 max.
No failure
Specification
Item
Appearance
Capacitance Change
I. R.
D.F.
Dielectric Strength
No marked defect
Within
T20%
More than 10,000M
Ω or 500Ω · F
(Whichever is smaller)
50, 100V
10, 16, 25V
6.3V
0.07 max.
0.09 max.
0.15 max.
No failure
Specification
Item
Appearance
Capacitance Change
I. R.
D.F.
Dielectric Strength
No marked defect
Within
T30%
More than 1,000M
Ω or 50Ω · F
(Whichever is smaller)
50, 100V
10, 16, 25V
6.3V
0.1 max.
0.125 max.
0.2 max.
No failure
Specification
Item
Appearance
Capacitance Change
I. R.
D.F.
Dielectric Strength
No marked defect
Within
T30%
More than 500M
Ω or 25Ω · F
(Whichever is smaller)
50, 100V
10, 16, 25V
6.3V
0.1 max.
0.125 max.
0.2 max.
No failure
Specification
Specifications and Test Methods
32
6


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