(DOC# 14-02-018 REV I ECN# 01-1001)

6

The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.

NanoAmp Solutions, Inc.

N04L163WC1A

Timing Test Conditions

Item

Input Pulse Level

Input Rise and Fall Time

5ns

Input and Output Timing Reference Levels

Output Load

CL = 30pF

Operating Temperature

Timing

Item

Symbol

-70

Units

2.3 - 2.65 V

2.7 - 3.6 V

Min.

Max.

Min.

Max.

Read Cycle Time

85

70

ns

Address Access Time

85

70

ns

Chip Enable to Valid Output

85

70

ns

Output Enable to Valid Output

30

25

ns

Byte Select to Valid Output

85

70

ns

Chip Enable to Low-Z output

10

10

ns

Output Enable to Low-Z Output

55

ns

Byte Select to Low-Z Output

10

10

ns

Chip Disable to High-Z Output

0

20

0

20

ns

Output Disable to High-Z Output

0

20

0

20

ns

Byte Select Disable to High-Z Output

0

20

0

20

ns

Output Hold from Address Change

10

10

ns

Write Cycle Time

85

70

ns

Chip Enable to End of Write

50

50

ns

Address Valid to End of Write

50

50

ns

Byte Select to End of Write

50

50

ns

Write Pulse Width

40

40

ns

Address Setup Time

00

ns

Write Recovery Time

00

ns

Write to High-Z Output

20

20

ns

Data to Write Time Overlap

40

40

ns

Data Hold from Write Time

00

ns

End Write to Low-Z Output

55

ns