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74ABT541PWDH Datenblatt(PDF) 3 Page - NXP Semiconductors |
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74ABT541PWDH Datenblatt(HTML) 3 Page - NXP Semiconductors |
3 / 11 page Philips Semiconductors Product specification 74ABT541 Octal buffer/line driver (3-State) 1998 Jan 16 3 LOGIC SYMBOL (IEEE/IEC) EN 19 2 18 3 17 416 5 15 1 & 614 713 8 12 911 SA00204 PIN DESCRIPTION PIN NUMBER SYMBOL NAME AND FUNCTION 2, 3, 4, 5, 6, 7, 8, 9 A0 – A7 Data inputs 18, 17, 16, 15, 14, 13, 12, 11 Y0 – Y7 Data outputs 1, 19 OE0, OE1 Output enables 10 GND Ground (0V) 20 VCC Positive supply voltage FUNCTION TABLE INPUTS OUTPUTS OE0 OE1 An Yn L L X H L L H X L H X X L H Z Z H = High voltage level L = Low voltage level X = Don’t care Z = High impedance ”off” state ABSOLUTE MAXIMUM RATINGS1, 2 SYMBOL PARAMETER CONDITIONS RATING UNIT VCC DC supply voltage –0.5 to +7.0 V IIK DC input diode current VI < 0 –18 mA VI DC input voltage3 –1.2 to +7.0 V IOK DC output diode current VO < 0 –50 mA VOUT DC output voltage3 output in Off or High state –0.5 to +5.5 V IOUT DC output current output in Low state 128 mA Tstg Storage temperature range –65 to 150 °C NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 °C. 3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. |
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